Failure Analysis: High Technology Devices

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Failure Analysis: High Technology...

Failure Analysis: High Technology Devices

Daniel J. D. Sullivan, Eric J. Carleton

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The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.

Covers methods and analytical techniques used to find root cause for failures in high technology devices.
Examples from real experiences in failure analysis laboratories.
Descriptions of how to perform the wok with details, not just theory.

Godina:

2022

Izdavač:

De Gruyter

Jezik:

english

Strane:

128

ISBN 10:

1501524798

ISBN 13:

9781501524790

Fajl:

EPUB, 8.97 MB

IPFS:

,

english, 2022

Preuzeti (epub, 8.97 MB)

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